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    IN CIRCUIT and functional tester

    • 產品名稱:IN CIRCUIT and functional tester
    • 產品型號:Compact SL
    • 產品廠商:seica
    • 產品文檔:
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    簡單介紹
    This configuration offers a completely automated solution via an integrated, SMEMA-compatible conveyor system, allowing completely automatic board handling and easy integration into high volume production lines. Configurable as ICT,

    IN CIRCUIT and functional tester

    的詳細介紹

    This configuration offers a completely automated solution via an integrated, SMEMA-compatible conveyor system,  allowing completely automatic board handling and easy integration into high volume production lines. Configurable as ict, pre-functional, functional and combinational. The compact footprint and the compliance with WCM criteria, enable easy and successful integration both in-line and/or within an automated test  island. Cost reduction and high throughput guaranteed.

    Compact SL is particularly suitable for:

    • parametric and in-circuit tests
    • functional tests
    • On-board programming
    • In-line integration
    • High-volume production
    • Automated test islands
    • Operator-free use
    • Handling costs reduction


    Features

    • Up to 1536 analog channels
    • Up to 128 hybrid channels (digital channel up to 10 MHz)
    • Reaching Up to 6 user power supply units
    • 2-JOB paralllel test with standard cabinet
    • 4-JOB parallel test with double cabinet
    • OPENFIX for open pin identification on digital components and connectors
    • Universal on-board programmer (up to 8 in parallel)
    • Boundary-scan test
    • Self-test at the module level
    • Receiver with pneumatic press and upper contrasts
    • Off-line Programming and Repair Stations
    • barcode and 2D code reading management; automatic statistic data collection
    • Automated programming via CAD data import



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